15.2 A 2048x60m4 SRAM Design in Intel 4 with an Around-the-Array Power-Delivery Scheme Using PowerVia
Daeyeon Kim, Yusung Kim, Ayush Shrivastava, Gyusung Park, Anandkumar Mahadevan Pillai, Kunal Girish Bannore, Tri Doan, Muktadir Rahman, Gwanghyeon Baek, Clifford Ong, Xiaofei Wang, Zheng Guo, Eric Karl
2024 · 인용 4
The ever-increasing demand for energy-efficient computing motivates novel innovations in advanced process technologies. Power through-silicon via (TSV) technology (PowerVia) [1], [2] is introduced to utilize low-resistance interconnects on the backside as a power-delivery network (PDN); its benefits include a reduced IR drop in the PDN and relaxed signal-routing congestion on the frontside. By using a technology with PowerVias, a fabricated CPU core achieved >90% standard-cell placement density and demonstrated ~6% higher performance, with ~30% lower IR drop [2].
Incorporation of PowerVias in SRAM array design carries unique tradeoffs, compared to logic design, which require a careful bitcell and array peripheral circuit design to enable an energy-efficient and a dense embedded memory. This paper presents a 108Mb high-current 6T-SRAM (HCC) and a 124Mb high-density 6T-SRAM (HDC) design implemented in Intel 4 with PowerVia technology, demonstrating improved or comparable VMINand improved performance with 2% higher bit density for the 2048×60m4 HCC instance compared to similar array designs not using PowerVia [3]. In addition, high-volume manufacturing Si data confirms that there is no unique yield or performance failure mode due to PowerVia.